Dynamic speckle illumination microscopy with wavelet prefiltering.

نویسندگان

  • Cathie Ventalon
  • Rainer Heintzmann
  • Jerome Mertz
چکیده

Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.

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عنوان ژورنال:
  • Optics letters

دوره 32 11  شماره 

صفحات  -

تاریخ انتشار 2007